Michael Chevalier

Contact information

Office: 401D

Phone:

Fax: (415) 514-4242

email: Michael.Chevalier-at-ucsf.edu
RESEARCH INTERESTS
Current research efforts have been focused on mathematical and computational modeling of stochastic or 'noisy' signaling pathways. I am currently applying particle-in-cell methods, originally used for studying plasma physics phenomena, in combination with monte carlo techniques as a means to simulate these pathways in 3D. Specific applications of the model have involved the study of the diffusion of receptors on dendrites after excocytic insertion events as well as the modeling of the unfolded protein response in the endoplasmic reticulum in yeast. On the theoretical side, I've been analytically solving diffusion-reaction problems both in 3D and 2D (membranes) as a means of analyzing the validity of the basic assumptions put forth in popular stochastic algorithms such as the Stochastic Simulation Algorithm (originally formulated by Gillespie, 1976).
Refereed Publications:
- Chevalier, M. W., W. B. Peter, U. S. Inan, T. F. Bell, and M. Spasojevic, Remote sensing of ionospheric disturbances associated with energetic particle precipitation using the South Pole VLF beacon, J. Geophys. Res., vol 112, 2007.
- Peter, W. B., M. Chevalier, and U. S. Inan, Perturbations of midlatitude subionospheric VLF signals associated with lower ionospheric disturbances during major geomagnetic storms, J. Geophys Res., vol. 111, 2006.
- Chevalier, M. W. and U. S. Inan (2006), A technique for efficiently modeling long-path propagation for use in both FDFD and FDTD, IEEE-AWPL, 5, 33, 525-8
- Chevalier, M. W, T. W. Chevalier, U.S. Inan, A PML utilizing k-vector information as applied to the whistler mode in a magnetized plasma, IEEE-APS, 54, 8, 2424-9, 2006.
-Chevalier, M. W. and U. S. Inan, A PML Using a Convolutional Curl Operator. and a Numerical Reflection Coefficient for General Linear Media, IEEE-APS, Vol 52., Num. 7, p. 1647, 2004.

- Chevalier, M., R. Luebbers, and V. Cable, FDTD Local Grid with Material Traverse,IEEE-APS, Vol 45., Num. 3, p. 411, 1997.